| Sensor | KAF-0400, KAF-0260 | KAF-1400, KAF-1600 | KAF-4200 | |||||||
| Grade | 0 | 1 | 2 | 0 | 1 | 2 | 3 | 1 | 2 | 3 |
| Points | 0 | 5 | 10 | 0 | 5 | 10 | 20 | 15 | 30 | 60 |
| Clusters | 0 | 0 | 4 | 0 | 0 | 4 | 8 | 0 | 12 | 24 |
| Columns | 0 | 0 | 2 | 0 | 0 | 2 | 4 | 0 | 6 | 12 |
| Point Defect: | A pixel which deviiates by more than 6% from neighboring pixels when illuminated to 70% saturation. |
| Cluster Defect: | A grouping of not more than 5 adjacent point defects. |
| Column Defect: | A grouping of point defects along a single column. |
| Neighboring Pixels: | The surrounding 100 x 100 pixels or ± 50 columns/rows. |
| Test Conditions: | 25° C |